Xensio Omniview

Under development

Developing 3D X-ray inspection for challenging food applications

Xensio is DIRATECH’s development programme for food inspection challenges that are difficult to resolve with conventional 2D X-ray. We are combining few-view imaging, 3D reconstruction and AI to investigate contaminants and internal defects in complex products.

We are inviting food producers and technology partners to help define and validate applications through pilot projects.

Apply to become a pilot partner Explore the approach
A snack bag shown half as packaging and half as an X-ray view, headed “See the unseen. In real time.”

When the inspection challenge needs another view

In a 2D X-ray image, product structures can overlap and obscure features that matter to an inspection decision. This can make it difficult to distinguish a contaminant or an internal defect from the product around it.

Xensio is being developed to add spatial information to that decision. The aim is to assess whether additional views and 3D information can improve inspection in specific food applications.

The approach

Multi-view imaging

Captures the product from different angles.

3D reconstruction

Uses those views to investigate internal structures and their position within the product.

AI and deep learning

Support the inspection analysis across all Xensio applications.

Performance will be established through application-specific testing. Detectability depends on the product, packaging, target material, defect size and inspection conditions.

Supported by the European Innovation Council

DIRATECH is a beneficiary of the European Innovation Council (EIC). The Xensio project is co-funded by the European Union, supporting our work on 3D X-ray inspection for challenging food applications.

European Innovation Council. Co-funded by the European Union

Views and opinions expressed are however those of the author(s) only and do not necessarily reflect those of the European Union or the European Innovation Council and SMEs Executive Agency (EISMEA). Neither the European Union nor the granting authority can be held responsible for them.

Bring us an inspection challenge

We welcome pilot proposals involving:

  • Contaminants that are difficult to distinguish from the surrounding product
  • Overlapping structures that complicate inspection
  • Internal quality defects such as voids and cavities

These are areas for evaluation. Suitability and achievable performance need to be established for each application.

Who should apply

Food producers

With a defined quality or inspection problem, access to representative products and a technical or quality contact who can help agree the evaluation criteria.

Machine builders and established X-ray equipment suppliers

Interested in evaluating a new capability for their customers or existing inspection platforms. Where relevant, the food producer and equipment partner can participate together.

How we would work together

  1. Define the application

    We discuss the product, packaging, target contaminant or defect, current inspection method and operating requirements.

  2. Agree the evaluation

    Together, we define representative samples, a relevant baseline and success criteria covering detection, false rejects and throughput where applicable.

  3. Scope the pilot

    If there is a fit, we agree technical work, responsibilities, data handling, timing and commercial terms before starting. Pilot timing depends on application fit and development readiness.

  4. Review the evidence

    We assess the results against the agreed criteria and decide whether further development, testing or an integration project is justified.

Apply to become a pilot partner

Tell us what you need to inspect and where your current approach falls short. We will review your application and contact you to discuss whether there is a fit for a Xensio pilot.

Xensio is under development. A pilot application starts a discussion; the scope and timing of any pilot are agreed individually.

What product do you inspect, what contaminant or defect matters, and what is difficult with your current approach?

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